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Semiconductors - Testing
isbn:0471974013
Author:Friedrich Beck
Publisher: Wiley (1998)
Binding: Hardcover, 190 pages
pricer: $210.00
deweydecimal: 621.3815
numberofpages: 190
salesrank: 1815422
isbn:0471739065
Semiconductor Material And Device Characterization
| isbn | 0471739065 |

| author | Dieter K. Schroder . |
| Publisher | IEEE |
| Publication date | January 2006 |
| Format | Hardcover |
| ISBN 13 | 9780471739067 |
| ISBN 10 | 0471739065 |
| Publisher | IEEE |
| Pages | 779 |
| List Price | $145.95 |
| subject: | TECHNOLOGY|Electronics / Semiconductors| |
| subject: | Textbooks (Various Levels)| |
| subject: | TECHNOLOGY|Electronics / Semiconductors|Semiconductors| |
| subject: | Semiconductors - Testing| |
Author:Dieter K. Schroder
Publisher: Wiley-IEEE Press (2006)
Binding: Hardcover, 800 pages
pricer: $152.50
deweydecimal: 621.38152
numberofpages: 800
salesrank: 121357
isbn:0750694726
Author:Amir Afshar
Publisher: Newnes (1995)
Binding: Hardcover, 350 pages
pricer: $125.00
deweydecimal: 621.381548
numberofpages: 350
salesrank: 1311074


